The document discusses various fault detection methods in sequential circuits, focusing on techniques such as path sensitization, Boolean difference, and the D-algorithm. It outlines assumptions related to fault types, specifically stuck-at faults, and describes different approaches for circuit testing. Key methodologies highlighted include circuit testing by knowledgeable experimenters and transition checking for less knowledgeable individuals, emphasizing the importance of input combinations in fault detection.
Stuck atFaults • Assumptions: Only 1 line is faulty Faulty line set to ‘1’ or ‘0’ Fault line can be at output orinput gate To detect them weproduce test factors (input combinations) which is obtained from *Fault Equivalents model as well.
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Approachesto Fault Detection •Circuit Test approach; experimenter iswell versed with circuitsand faultsoccurrence • TransitionChecking Approach; experimenter has leastknowledge of circuit but knows about the transition
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Path SensitizationMethod • Forcombinationallogic circuits onepowerful approach to test generation relies on path sensitizing, the application of input such that the output depends directly on the condition of the lead being tested • Path sensitizationis based on the assumption that the failuremechanismina gate results inits inputs or outputs being stuck atone or stuck at zero This fault is then traced along a path to the network output and its effects are noted