Fault DetectionMethods in Sequential Circuits Switching Theory and Logic Design – ETEC 205 ShivangDubey 20320802819
Methods ofFault Detection • PathSensitization • Boolean Difference • D-Algorithm • *FaultMatrix • *Partitioning • *State-TableAnalysis *: Beyond our approach
Fault • Physical defect withina circuit; may/may not cause system failure
Stuck atFaults • Assumptions:  Only 1 line is faulty  Faulty line set to ‘1’ or ‘0’  Fault line can be at output orinput gate To detect them weproduce test factors (input combinations) which is obtained from *Fault Equivalents model as well.
Approachesto Fault Detection • Circuit Test approach; experimenter iswell versed with circuitsand faultsoccurrence • TransitionChecking Approach; experimenter has leastknowledge of circuit but knows about the transition
Path SensitizationMethod • Forcombinational logic circuits onepowerful approach to test generation relies on path sensitizing, the application of input such that the output depends directly on the condition of the lead being tested • Path sensitizationis based on the assumption that the failuremechanismina gate results inits inputs or outputs being stuck atone or stuck at zero This fault is then traced along a path to the network output and its effects are noted
BooleanDifference • Algebraic algorithm for detecting faults • df/dxi = fxi(0) ⊕fxi(1)  Sa0 = xi*df/dxi = 1 [Stuck at0]  Sa1 = ͞xi*df/dxi = 1 [Stuck at 1]
x3x2(bar) x2 x2(bar) x1 x1x2 x3 y = x1x2 + x3x2(bar) Comparingboth terms on LHS to 1
D Algorithm • Formalversion of PathSensitizationMethod • Singular Cover: compactversion oftruth table  Each row is singular cube • PrimitiveD Cube: derivedfromSingular cover ofcorrect and faultysingular cover • PropagationD-Cube  Behaviors ofo/pandi/p
Propertiesof D Algorithm • 0 ∩0 = 0 ∩ x = x ∩ 0 = 0 • 1 ∩ 1= 1∩ x = x ∩ 1 = 1 • x ∩ x = x • 1 ∩0 = D • 0 ∩ 1 = D’
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Fault Detection Methods in Sequential System

  • 1.
    Fault DetectionMethods inSequential Circuits Switching Theory and Logic Design – ETEC 205 ShivangDubey 20320802819
  • 2.
    Methods ofFault Detection •PathSensitization • Boolean Difference • D-Algorithm • *FaultMatrix • *Partitioning • *State-TableAnalysis *: Beyond our approach
  • 3.
    Fault • Physical defectwithina circuit; may/may not cause system failure
  • 4.
    Stuck atFaults • Assumptions: Only 1 line is faulty  Faulty line set to ‘1’ or ‘0’  Fault line can be at output orinput gate To detect them weproduce test factors (input combinations) which is obtained from *Fault Equivalents model as well.
  • 5.
    Approachesto Fault Detection •Circuit Test approach; experimenter iswell versed with circuitsand faultsoccurrence • TransitionChecking Approach; experimenter has leastknowledge of circuit but knows about the transition
  • 6.
    Path SensitizationMethod • Forcombinationallogic circuits onepowerful approach to test generation relies on path sensitizing, the application of input such that the output depends directly on the condition of the lead being tested • Path sensitizationis based on the assumption that the failuremechanismina gate results inits inputs or outputs being stuck atone or stuck at zero This fault is then traced along a path to the network output and its effects are noted
  • 9.
    BooleanDifference • Algebraic algorithmfor detecting faults • df/dxi = fxi(0) ⊕fxi(1)  Sa0 = xi*df/dxi = 1 [Stuck at0]  Sa1 = ͞xi*df/dxi = 1 [Stuck at 1]
  • 10.
    x3x2(bar) x2 x2(bar) x1 x1x2 x3 y =x1x2 + x3x2(bar) Comparingboth terms on LHS to 1
  • 11.
    D Algorithm • Formalversionof PathSensitizationMethod • Singular Cover: compactversion oftruth table  Each row is singular cube • PrimitiveD Cube: derivedfromSingular cover ofcorrect and faultysingular cover • PropagationD-Cube  Behaviors ofo/pandi/p
  • 12.
    Propertiesof D Algorithm •0 ∩0 = 0 ∩ x = x ∩ 0 = 0 • 1 ∩ 1= 1∩ x = x ∩ 1 = 1 • x ∩ x = x • 1 ∩0 = D • 0 ∩ 1 = D’
  • 13.